[PDF.38kv] Microscopy of Semiconducting Materials 1995, Proceedings of the Institute of Physics Conference held at Oxford University, 20-23 March 1995

Microscopy of Semiconducting Materials 1995, Proceedings of the Institute of Physics Conference held at Oxford University, 20-23 March 1995

[PDF.ap38] Microscopy of Semiconducting Materials 1995, Proceedings of the Institute of Physics Conference held at Oxford University, 20-23 March 1995

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 |  1996-01-25 | Original language:English | PDF # 1 | File type: PDF | 795 pages

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This volume continues the tradition of previous meetings in the series and provides researchers with an overview of recent developments in the field. Contains invited review papers together with in-depth coverage of the latest research results. Encompassing techniques from transmission and scanning electron microscopy, X-ray topography and diffraction, scanning probe microscopy and atom probe microanalysis, as applied to the whole range of semiconducting materials.

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