[PDF.10it] Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology (Micro and Nano Technologies)

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology (Micro and Nano Technologies)

[PDF.mw55] Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology (Micro and Nano Technologies)

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 | #7845052 in Books |  William Andrew |  2012-12-11 | Original language:English | PDF # 1 |  9.25 x.75 x7.52l,1.55 | File type: PDF | 336 pages

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||About the Author|Petr Klapetek is Head, Department of Nanometrology at the Czech Metrology Institute, Czech Republic. His research focuses on the metrology scanning probe microscope (SPM) construction, a key standard for nanometrology.He also participates in the

Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve...

You easily download any file type for your device.Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology (Micro and Nano Technologies)   |  From Brand: William Andrew. I was recommended this book by a dear friend of mine.

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