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Reliability and Failure of Electronic Materials and Devices

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 | #2452567 in Books |  1998-06-12 | Ingredients: Example Ingredients | Original language:English | PDF # 1 |  9.02 x1.50 x5.98l,2.43 | File type: PDF | 692 pages

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||2 of 2 people found the following review helpful.| Great reference book|By Paolo Giai Miniet|This book has the rare quality to be complete and essential. It helped me a lot on my job having found in it a lot of useful informations. I still use it as a reference on the need.

Particularly, Chapter 11 (Characterization and failure analysis of material and devices) gives detailed explanations about the most commoms failu|From the Back Cover|This book introduces the reader to the widely dispersed reliability literature of microelectronic and electro-optical devices. It integrates a treatment of chip models used to explain degradation, and the statistical handling of lifetime dat

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the stat...

You easily download any file type for your gadget.Reliability and Failure of Electronic Materials and Devices   |  Milton Ohring. I was recommended this book by a dear friend of mine.

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