[PDF.98mu] Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study ... 1 - 13 October 2002 (Nato Science Series II:)

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study ... 1 - 13 October 2002 (Nato Science Series II:)

[PDF.yk12] Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study ... 1 - 13 October 2002 (Nato Science Series II:)

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 | #16240657 in Books |  Paula Maria Vilarinho Yossi Rosenwaks Angus Kingon |  2005-02-21 |  2005-02-21 | Original language:English | PDF # 1 |  9.25 x1.19 x6.10l,1.61 | File type: PDF | 488 pages

 | Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study 1 13 October 2002 Nato Science Series II

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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successf...

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